Home / Products / Integrated Circuits (ICs) / Logic - Specialty Logic / SN74BCT8374ADWRG4
Manufacturer Part Number | SN74BCT8374ADWRG4 |
---|---|
Future Part Number | FT-SN74BCT8374ADWRG4 |
SPQ / MOQ | Contact Us |
Packing Material | Reel/Tray/Tube/Others |
Series | 74BCT |
SN74BCT8374ADWRG4 Status (Lifecycle) | In Stock |
Part Status | Obsolete |
Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
Supply Voltage | 4.5V ~ 5.5V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |
Country of Origin | USA/JAPAN/MALAYSIA/MEXICO/CN |
SN74BCT8374ADWRG4 Weight | Contact Us |
Replacement Part Number | SN74BCT8374ADWRG4-FT |
SSTV16857DGV,112
NXP USA Inc.
SSTV16857DGV,118
NXP USA Inc.
SSTVA16857AG
IDT, Integrated Device Technology Inc
SSTVA16857AGLF
IDT, Integrated Device Technology Inc
SSTVA16857AGLFT
IDT, Integrated Device Technology Inc
SSTVA16857AGT
IDT, Integrated Device Technology Inc
SSTVF16857AG
IDT, Integrated Device Technology Inc
SSTVF16857AGLF
IDT, Integrated Device Technology Inc
SSTVF16857AGLFT
IDT, Integrated Device Technology Inc
SSTVF16857AGT
IDT, Integrated Device Technology Inc
XC3S400A-4FG400C
Xilinx Inc.
XC6SLX45-N3FG484I
Xilinx Inc.
APA1000-CGS624B
Microsemi Corporation
EP2AGZ350HF40C3N
Intel
5SGXEB9R3H43I3L
Intel
EP3SL150F1152I3
Intel
A40MX02-1PQG100I
Microsemi Corporation
LFXP3E-3Q208I
Lattice Semiconductor Corporation
LCMXO2-7000HE-6FG484I
Lattice Semiconductor Corporation
10AX115N4F40I3SGE2
Intel